Testing highly thermal conductive slab or sheet samples
The Slab Measurement Module enables direct and simultaneous testing in-plane Thermal Conductivity, and the in-plane Thermal Diffusivity, of a highly thermal conductive slab or sheet sample, using our Hot Disk® or Hot Strip® sensors. From these two parameters, the Specific Heat Capacity of the sample can be extracted. The slab or sheet can be a metal plate, graphite sheet or laminate, semiconductor wafer, silicone film, metal foil, etc. Both single-sided and double-sided sample testing are supported, where the former enables rapid QC testing while the latter maximizes measurement accuracy.
Our foundational slab measurement technique relies on clamping two identical slab sample pieces with the Hot Disk® or Hot Strip® sensor in between and providing thermal insulation to this set-up. The latter is often arranged by insulating foam on both sample/sensor set-up sides. The Slab Measurement Module is straightforward to work with. It only involves setting the measurement time, output power of the transient temperature recording, and prior knowledge of the slab thickness as an input parameter. Slab samples of thickness ranging from several millimeters down to micrometers can be tested.
We invented this slab measurement technique, and the theory behind it is presented in our paper published in Review Scientific Instruments in 19941. It meets ISO standard 22007-2. Hot Disk AB contributed to the development of this standard.
Thermal Conductivity Range:
Instruments | Range |
---|---|
TPS 3500 | 11 to 1800 W/m/K |
TPS 2500 S | 11 to 1500 W/m/K |
TPS 2200, TPS 1000 | 11 to 500 W/m/K |
TPS 500 S | 11 to 200 W/m/K |