Using the Slab Measurement Module, wafers, sheets or slabs of high-conductivity materials can be tested. Among the samples suitable for testing with this method we find e.g. metals, semi-conductors and graphite. With prior knowledge of the sample thickness, this method requires only measurement time and output power as in-data, making it very easy and straightforward to work with.
The Slab Measurement Module requires two sample halves for accurate measurements.
Thermal Conductivity Range:
|TPS 3500, TPS 2500 S||1* to 1500 W/m/K|
|TPS 2200||1* to 500 W/m/K|
|TPS 500 S||1* to 200 W/m/K|
* To achieve maximum accuracy a minimum of 5 W/m/K is required, however, reproducibility will still be good down to 1 W/m/K.